AI plays a role in improving defect capture rate and distinguishing between yield-killing and nuisance defects. New developments in wafer edge inspection are proving essential to bonded wafer yields.

By combining experimental evolution in soft agar, inducible control of run duration, visualization of flagella, and theoretical modeling, the authors demonstrate that the optimal mean run duration for ...

Behavioral data models replace static programmatic approaches with precision targeting at the exact moment of purchase ...

Valve is still determined to release its living room PC game console, called the Steam Machine, despite skyrocketing prices for gaming hardware across the board, including the company's own Steam Deck ...

This important study reveals distinct representations of task-related information in the dendrites and somata of cortical neurons during sensorimotor learning and behavioral adaptation. The evidence ...